The phenom pharos G2 is designed to be the most accessible electron microscopy instrument in MEM-C. It is capable of delivering high resolution images at the level of traditional SEM. This instrument expands its acceleration voltage range down to 1 kV, and up to 20 kV to accommodate insulating and beam-sensitive samples revealing the finest details with a resolution of up to 2 nm for secondary electron (SE) detector and 3 nm for back scattered electron detector (BSE). It integrates an energy-dispersive x-ray spectroscopy detector (EDS) as well for chemical characterization and analysis. Additionally, a stage for STEM analysis is available for high-angle annular dark field (HAADF), dark field (DF), and bright field (BF) imaging. This desktop SEM/STEM instrument is designed to be available for users with any background with an accessible operation procedure including sample loading and imaging acquisition thanks to its user-friendly software.
Capabilities
- User-friendly operation software with default settings, designed to be accessible for non-microscopy background users.
- 5 kV, 10 kV, 15 kV, and 20 kV acceleration voltages available with high vacuum, medium vacuum and low vacuum modes.
- SE, BSE, and EDS detectors for SEM mode.
- HAADF, DF, and BF detectors for STEM mode.
- Sample size up to 25mm and sample high up to 35mm
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications
Click here to view the manufacturer specifications.
The Park systems AFM is a scanning probe tool that can image surfaces down to the nanometer scale. It uses a sharp probe whose z-position over the surface of interest is controlled in a closed-loop feedback measuring the atomic forces of the surface on the probe. These forces are strongly dependent on the probe-surface distance and so the z-adjustments required to maintain constant force during scanning are directly related to the topographical and morphological features. This AFM is a versatile tool to probe and clean various devices, with an additional control on the temperature.
Capabilities
- AFM scanning modes available : non contact mode, tapping mode, contact mode
- An integrated Lock-in allows to perform electric force microscopy such as Piezoelectric Force Microcopy and Kelvin Probe Force Microscopy.
- Motorized x-y scanning stage with magnetic mounting of samples that allows to mount a wide range of samples.
- Standard AFM tips available on-site, specialty tips can be purchased by request
- Optional heating stage is available to probe samples at a wide range of temperatures (room temperature to 300C).
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications
Click here to view the manufacturer specifications.
The Bruker Dimension Edge AFM measures nanometer-scale microscopy by rastering (over a surface of interest) a sharp probe, the z-position of which is controlled in a closed-loop feedback on a measure of the atomic forces on the probe by the surface. These forces are strongly dependent on the probe-surface distance, and so the z-adjustments required to maintain constant force during rastering are directly related to the topographical and morphological features. This AFM is inside of the 2D materials manipulation glovebox, allowing study of air- and water-sensitive samples prepared inside the glovebox with direct access to additional in-glovebox capabilities, e.g. optical microscopy, and 2D stacking. The Edge has an ergonomic design with facile set-up (sample loading, cantilever mounting and calibration) and scan control.
Capabilities
- Glovebox integration enables measurement of air and water sensitive samples
- Dry isolation stage minimizes vibrational noise from glovebox environment
- Motorized x-y stage with vacuum sample chuck allows easy mounting and access to wafer-scale samples
- AFM modes available: contact mode, non-contact “tapping” mode, proprietary Peak-Force mode
- Standard AFM tips available on-site, specialty tips can be purchased by request
- Piezoelectric Force Microscopy available
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications
Click here to view the manufacturer specifications.
The Bruker Dimension Icon AFM measures nanometer-scale microscopy by rastering (over a surface of interest) a sharp probe, the z-position of which is controlled in a closed-loop feedback on a measure of the atomic forces on the probe by the surface. These forces are strongly dependent on the probe-surface distance, and so the z-adjustments required to maintain constant force during rastering are directly related to the topographical and morphological features. The Icon AFM incorporates the latest evolution of Bruker’s nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y.
Capabilities
- Significantly reduced noise floor at less than 30 pm enabling imaging at sub-nanometer resolution
- Drift rates less than 200pm per minute render distortion-free images immediately
- Integrated alignment tools deliver quick and optimized probe positioning
- High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
- Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
- AFM modes available: contact mode, non-contact “tapping” mode, proprietary Peak-Force mode
- Standard AFM tips available on-site, specialty tips can be purchased by request
- Piezoelectric Force Microscopy available
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications and Research Highlights
Click here to view the manufacturer specifications.
