The phenom pharos G2 is designed to be the most accessible electron microscopy instrument in MEM-C. It is capable of delivering high resolution images at the level of traditional SEM. This instrument expands its acceleration voltage range down to 1 kV, and up to 20 kV to accommodate insulating and beam-sensitive samples revealing the finest details with a resolution of up to 2 nm for secondary electron (SE) detector and 3 nm for back scattered electron detector (BSE). It integrates an energy-dispersive x-ray spectroscopy detector (EDS) as well for chemical characterization and analysis. Additionally, a stage for STEM analysis is available for high-angle annular dark field (HAADF), dark field (DF), and bright field (BF) imaging. This desktop SEM/STEM instrument is designed to be available for users with any background with an accessible operation procedure including sample loading and imaging acquisition thanks to its user-friendly software.
Capabilities
- User-friendly operation software with default settings, designed to be accessible for non-microscopy background users.
- 5 kV, 10 kV, 15 kV, and 20 kV acceleration voltages available with high vacuum, medium vacuum and low vacuum modes.
- SE, BSE, and EDS detectors for SEM mode.
- HAADF, DF, and BF detectors for STEM mode.
- Sample size up to 25mm and sample high up to 35mm
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications
Click here to view the manufacturer specifications.
